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Power Device Test
Power semiconductor devices are the core devices of energy conversion. Whatever MOSFET or IGBT, each plays an important role in the regulation of electric energy. The loss of the power device itself is an important factor in affecting the overall efficiency of the power supply. The high loss will cause the device to heat up and may affect the service life of the power supply. The oscilloscopes generally use a transient power integration method to measure the loss waveform of a power device. RIGOL oscilloscopes support power testing. The high-voltage differential and current probes equipped with the oscilloscopes can meet a wide range of testing needs. The UltraPower Analysis PC software allows you to export test data, complete online and offline tests of multiple parameters, and generate reports.